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Editors
See all (27)yuya kajikawa
Tokyo Institute of Technology
Meguro City, Japan
Specialty Chief Editor
Patent Analytics
dong huo
Harbin Institute of Technology, Shenzhen
Shenzhen, China
Associate Editor
Patent Analytics
wonjoon kim
Korea Advanced Institute of Science and Technology (KAIST)
Daejeon, Republic of Korea
Associate Editor
Patent Analytics
antonio messeni petruzzelli
Politecnico di Bari
Bari, Italy
Associate Editor
Patent Analytics
