yuya kajikawa
Tokyo Institute of Technology
Meguro City, Japan
Specialty Chief Editor
Patent Analytics
Harbin Institute of Technology, Shenzhen
Shenzhen, China
Associate Editor
Patent Analytics
Korea Advanced Institute of Science and Technology (KAIST)
Daejeon, Republic of Korea
Associate Editor
Patent Analytics
Politecnico di Bari
Bari, Italy
Associate Editor
Patent Analytics
National Chiao Tung University
Hsinchu, Taiwan
Associate Editor
Patent Analytics
VTT Technical Research Centre of Finland Ltd
Espoo, Finland
Associate Editor
Patent Analytics
Polytechnic University of Milan
Milan, Italy
Review Editor
Patent Analytics
University of Zagreb
Zagreb, Croatia
Review Editor
Patent Analytics
Yale University
New Haven, United States
Review Editor
Patent Analytics
University of Strathclyde
Glasgow, United Kingdom
Review Editor
Patent Analytics
Ithaca College
Ithaca, United States
Review Editor
Patent Analytics
VTT Technical Research Centre of Finland Ltd
Espoo, Finland
Review Editor
Patent Analytics
National Chi Nan University
Puli, Nantou, Taiwan
Review Editor
Patent Analytics
University of California, Santa Barbara
Santa Barbara, United States
Review Editor
Patent Analytics
Harbin Institute of Technology
Harbin, China
Review Editor
Patent Analytics
The University of Tokyo
Bunkyo, Japan
Review Editor
Patent Analytics