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ORIGINAL RESEARCH article

Front. Plant Sci.
Sec. Technical Advances in Plant Science
Volume 15 - 2024 | doi: 10.3389/fpls.2024.1491493

An Explainable Bi-LSTM Model for Winter Wheat Yield Prediction

Provisionally accepted
  • 1 School of Civil and Environmental Engineering, Faculty of Engineering and Information Technology, University of Technology Sydney, Ultimo, Australia
  • 2 School of Science and Technology, Faculty of Science, Agriculture, Buiness and Law, University of New England, Armidale, Australia
  • 3 Department of Aerospace Engineering, Faculty of Engineering, Putra Malaysia University, Serdang, Malaysia
  • 4 Department of Geology and Geophysics, College of Science, King Saud University, Riyadh, Saudi Arabia, Riyadh, Saudi Arabia
  • 5 Artificial Intelligence and Machine Learning Department, Symbiosis Institute of Technology, Symbiosis International (Deemed) University, Pune 412115, India, Pune, Maharashtra, India
  • 6 Department of Science Education, Kangwon National University, Chuncheon-si, 24341, Korea, Chuncheon-si, Republic of Korea

The final, formatted version of the article will be published soon.

    Accurate, reliable and transparent crop yield prediction is crucial for informed decision-making by governments, farmers, and businesses regarding food security as well as agricultural business and management. Deep learning (DL) methods, particularly Long Short-Term Memory networks, have emerged as one of the most widely used architectures in yield prediction studies, providing promising results. Although other sequential DL methods like 1D Convolutional Neural Networks (1D-CNN) and Bidirectional long short-term memory (Bi-LSTM) have shown high accuracy for various tasks, including crop yield prediction, their application in regional scale crop yield prediction remains largely unexplored. Interpretability is another pressing and challenging issue in DL-based crop yield prediction, a factor that ensures the reliability of the model. Thus, this study aims to develop and implement an explainable DL model capable of accurately predicting crop yield and providing explanations for the predictions. To achieve this, we developed three state-of-the-art sequential DL models: LSTM, 1D CNN, and Bi-LSTM. We then employed three popular interpretability techniques: Local interpretable model-agnostic explanations (LIME), Integrated Gradient (IG) and Shapley Additive Explanation (SHAP) to understand the decision-making process of the models. The Bi-LSTM model outperformed other models in terms of predictive performance (R2 up to 0.88) and generalizability across locations and ranges of yield data. Explainability analysis reveals that enhanced vegetation index (EVI), temperature and precipitation at later stages of crop growth are most important in determining Winter wheat yield. Further, we demonstrated that XAI methods can also be used to understand the decision-making process of the models, to understand instances such as high- and low-yield samples, to find possible explanations for erroneous predictions, and to identify regions impacted by particular stress. By employing advanced DL techniques along with an innovative approach to explainability, this study achieves highly accurate yield prediction while providing intuitive insights into the model’s decision-making process..

    Keywords: crop yield, Explainability, Shap, Lime, Integrated gradients, Bidirectional LSTM

    Received: 04 Sep 2024; Accepted: 13 Dec 2024.

    Copyright: © 2024 Joshi, Pradhan, Chakraborty, Varatharajoo, Alamri, Gite and Lee. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

    * Correspondence: Biswajeet Pradhan, School of Civil and Environmental Engineering, Faculty of Engineering and Information Technology, University of Technology Sydney, Ultimo, Australia

    Disclaimer: All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.