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REVIEW article
Front. Electron.
Sec. Nano- and Microelectronics
Volume 6 - 2025 |
doi: 10.3389/felec.2025.1506112
Electronics Packaging Materials and Component-level Degradation Monitoring
Provisionally accepted- Delft University of Technology, Delft, Netherlands
Electronic components are complex systems consisting of a combination of different materials, which undergo degenerative changes over time following the second law of thermodynamics.The loss of their quality or functionality is reflected in degraded performance or behaviour of electronic components, which can lead to failures during their operation lifetime. Thus, it is crucial to understand the physics of material degradation and the factors causing it to ensure component reliability. This paper focuses on the physics-of-degradation of packaging materials, which are typically exposed the most to the environmental and operating loads. The content of this article is organised into three parts. First, an overview of the packaging technology and encapsulating materials is presented. Then, the most common degradation-causing factors and package-associated failure modes are reviewed. Lastly, the hardware requirements are discussed, including specialised sensors, measurement techniques, and Digital Twins, to capture the degradation effects and facilitate component-level health monitoring for microelectronics.
Keywords: Electronics packaging, Encapsulation material, Moulding compounds, physics of degradation, Thermomechanical ageing, Failure mechanisms, Digital Twin, Prognostics and health management
Received: 04 Oct 2024; Accepted: 13 Jan 2025.
Copyright: Ā© 2025 Inamdar, van Driel and Zhang. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
* Correspondence:
Adwait Inamdar, Delft University of Technology, Delft, Netherlands
Disclaimer: All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.