Pushing Frontiers - Imaging For Photon Science

About this Research Topic

Background

Developments of cutting-edge X-ray imaging detectors are largely driven by experiments at the large photon science facilities, i.e. the synchrotron radiation sources and free-electron lasers (FELs) which enable a wealth of investigations in physics, material science, biology, chemistry, environmental sciences, and beyond.

The next generation radiation sources, namely diffraction-limited storage-rings (DLSR) and high repetition rate FELs operated in the continuous wave (CW) mode, not only offer brilliant opportunities for research but also pose new challenges and requirements for the X-ray detectors required to exploit them fully. Examples include the high count rate capability required at the DLSRs, the ultra high, continuous frame rate and data throughput at the FELs, and a broad photon energy range from tens of eV to hundreds of keV spanned by the facilities.

In order to meet the new requirements posed by the most advanced photon science facilities envisioned or already under development around the world, today various novel photon detection and imaging concepts are being investigated, and detector technologies are advancing fast.
The goal of this research topic is to address the challenges and discuss the critical problems encountered in imaging systems for photon science, including but not limited to sensing materials, ASICs, readout electronics, detector systems, and data reduction, Moreover, it will encompass a discussion of the development strategies, technological advances, and recent achievements of each subject - thereby facilitating the realization of complete concepts for novel imaging systems as well as further developments of individual detector technologies.

For this research topic, we aim for manuscripts, both reviews and original research papers, covering advances in all aspects relevant to photon science imaging systems - including but not limited to the following topics:

- Sensor technologies: LGADs, CMOS, CCD, High-Z, new sensing materials, thin entrance window processing methods, sensor simulation and new models, MCP, Low-Temperature, SiPM etc.
- ASICs: fully depleted CMOS, SiGe, GaN, SOI, fast ADCs, ultra-low noise designs, high speed on-chip readout, 3D integrated ASICs and TSVs, advanced pixel architectures
- Readout and data: silicon photonics, high-speed data readout, data compression, in-chip data reduction, machine learning and calibration
- Systems: mechanics, cooling and integration
- Next generation detectors for diffraction limited storage rings and FELs: High count rate photon counting detectors, high frame rate charge-integrating detectors, event-based detectors
- Spectral imaging detectors: PNCCD, ultra-low noise detectors.

Keywords: Imaging detector concepts and technologies, X-ray detectors, sensors, ASICs, readout electronics, system, next generation detectors

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