The final, formatted version of the article will be published soon.
ORIGINAL RESEARCH article
Front. Plant Sci.
Sec. Plant Breeding
Volume 15 - 2024 |
doi: 10.3389/fpls.2024.1417588
Mapping QTL with Additive and Epistatic Effects for Awn Length and Their Effects on Kernel-related Traits in CommonWheat
Provisionally accepted
Nina Sun
1
Wei Liu
1*
Deyang Shi
1*
Chunhua Zhao
2
Jinlian Ou
2*
Yuanze Song
2*
Zilin Yang
2*
Han Sun
2*
Yongzhen Wu
2*
Ran Qin
2*
Tangyu Yuan
1*
Yanlin Jiao
1*
Linzhi Li
1*
Fa Cui
2*- 1 Yantai Academy of Agricultural Science, Yantai, China
- 2 College of Agriculture, Ludong University, Yantai, Shandong Province, China
Key message Seven putative additive QTL and 30 pairwise epistatic QTL for awn length were identified and their effects on kernel-related traits were characterized. Wheat awns are crucial determinants of wheat yield due to their capacity to photosynthesize and exchange gas. Understanding the genetic basis of awn length (AL) is essential for improving wheat yield in molecular breeding programs. In this study, quantitative trait loci (QTL) of AL was analyzed using recombinant inbred lines (RILs) mapping population referred to as YY-RILs, which was derived from a cross between Yannong 15 (YN15) and Yannong 1212 (YN1212). Seven putative additive QTL and 30 pairwise epistatic QTL for AL were identified. Among them, five novel additive QTL (except qAl-2A and qAl-5A.2) and 30 novel pairwise epistatic QTL were identified. qAl-5A.1 was repeatedly identified in all the five environment datasets, which was considered to be one novel stable QTL for AL with minor additive effects. eqAl-2B.2-2 significantly interacted with eight loci and could be of great importance in regulating awn development. The genes associated with the major stable QTL of qAl-5A.2 and the minor stable QTL of qAl-2A were B1 and WFZP-A, respectively. Awn lengths exhibited significant genetic correlations with kernel weight and kernels per spike, which could affect grain protein content to a lesser extent. This study enhances our understanding of the genetic basis of awn development and identifies novel genes as well as marker for future genetic improvement of wheat yield.
Keywords: wheat, QTL, Awn length, Kernel-related traits, Genetic effects qAl-2B.2-E1 qAl-2B.2-E4 qAl-5A.2-E1 qAl-5A.2-E2 qAl-5A.2-E3 qAl-5A.2-E4 qAl-5A.2-BLUE
Received: 15 Apr 2024; Accepted: 31 Jul 2024.
Copyright: © 2024 Sun, Liu, Shi, Zhao, Ou, Song, Yang, Sun, Wu, Qin, Yuan, Jiao, Li and Cui. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
* Correspondence:
Wei Liu, Yantai Academy of Agricultural Science, Yantai, China
Deyang Shi, Yantai Academy of Agricultural Science, Yantai, China
Jinlian Ou, College of Agriculture, Ludong University, Yantai, 264025, Shandong Province, China
Yuanze Song, College of Agriculture, Ludong University, Yantai, 264025, Shandong Province, China
Zilin Yang, College of Agriculture, Ludong University, Yantai, 264025, Shandong Province, China
Han Sun, College of Agriculture, Ludong University, Yantai, 264025, Shandong Province, China
Yongzhen Wu, College of Agriculture, Ludong University, Yantai, 264025, Shandong Province, China
Ran Qin, College of Agriculture, Ludong University, Yantai, 264025, Shandong Province, China
Tangyu Yuan, Yantai Academy of Agricultural Science, Yantai, China
Yanlin Jiao, Yantai Academy of Agricultural Science, Yantai, China
Linzhi Li, Yantai Academy of Agricultural Science, Yantai, China
Fa Cui, College of Agriculture, Ludong University, Yantai, 264025, Shandong Province, China
Disclaimer: All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.