AUTHOR=Gracia-Romero Adrian , Rufo Rubén , Gómez-Candón David , Soriano José Miguel , Bellvert Joaquim , Yannam Venkata Rami Reddy , Gulino Davide , Lopes Marta S. TITLE=Improving in-season wheat yield prediction using remote sensing and additional agronomic traits as predictors JOURNAL=Frontiers in Plant Science VOLUME=14 YEAR=2023 URL=https://www.frontiersin.org/journals/plant-science/articles/10.3389/fpls.2023.1063983 DOI=10.3389/fpls.2023.1063983 ISSN=1664-462X ABSTRACT=

The development of accurate grain yield (GY) multivariate models using normalized difference vegetation index (NDVI) assessments obtained from aerial vehicles and additional agronomic traits is a promising option to assist, or even substitute, laborious agronomic in-field evaluations for wheat variety trials. This study proposed improved GY prediction models for wheat experimental trials. Calibration models were developed using all possible combinations of aerial NDVI, plant height, phenology, and ear density from experimental trials of three crop seasons. First, models were developed using 20, 50 and 100 plots in training sets and GY predictions were only moderately improved by increasing the size of the training set. Then, the best models predicting GY were defined in terms of the lowest Bayesian information criterion (BIC) and the inclusion of days to heading, ear density or plant height together with NDVI in most cases were better (lower BIC) than NDVI alone. This was particularly evident when NDVI saturates (with yields above 8 t ha-1) with models including NDVI and days to heading providing a 50% increase in the prediction accuracy and a 10% decrease in the root mean square error. These results showed an improvement of NDVI prediction models by the addition of other agronomic traits. Moreover, NDVI and additional agronomic traits were unreliable predictors of grain yield in wheat landraces and conventional yield quantification methods must be used in this case. Saturation and underestimation of productivity may be explained by differences in other yield components that NDVI alone cannot detect (e.g. differences in grain size and number).