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ORIGINAL RESEARCH article
Front. Phys.
Sec. Chemical Physics and Physical Chemistry
Volume 13 - 2025 | doi: 10.3389/fphy.2025.1592186
This article is part of the Research Topic Calculation and Design of Two-dimensional Thermoelectric and Piezoelectric Materials, Volume II View all 3 articles
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Using a two-temperature (2T-MD) model in molecular dynamics simulations, we investigated the effects of irradiation energy, irradiation temperature, electron density and the electron-phonon (e-ph) coupling activation time on the cascade dynamics in tungsten. The results showed that the electronic effect has significant impacts on the formation of irradiation defects, especially under high-energy irradiation. Compared with the results of classical molecular dynamics calculations, the numbers of peak and surviving defects calculated using 2T-MD model were significantly reduced under high-energy ion irradiation (~150 keV). The number of peak defects increased with temperature, while the surviving defect showed a similar number. With the increase of electron density, the number of peak defect decreased. However, the number of surviving defects was almost unaffected by the electron density. The later the e-ph coupling activation time, the more the number of peak and surviving defects. The mechanisms were well explained by analyzing the local atomic and electronic temperatures. Our work provides valuable information for understanding the electronic effects on the primary radiation damage in tungsten.
Keywords: Tungsten, two-temperature model, Electronic effect, local temperature, molecular dynamics
Received: 12 Mar 2025; Accepted: 03 Apr 2025.
Copyright: © 2025 Sheng, Wei, Zhang, Zhang, Pu and Li. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
* Correspondence:
Chao Zhang, Anhui University of Science and Technology, Huainan, China
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