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ORIGINAL RESEARCH article
Front. Phys.
Sec. Optics and Photonics
Volume 13 - 2025 | doi: 10.3389/fphy.2025.1517445
This article is part of the Research Topic Novel Optical Measurement and Imaging Technologies using Broadband Light Sources View all 5 articles
The effect of muzzle blast wave on light screen in external ballistic measurement
Provisionally accepted- School of Optoelectronic Engineering, Xi'an Technological University, Xi’an, Shaanxi Province, China
In measuring initial velocity, light screen detectors (LSD) are positioned closer to the muzzle. The light screen of the LSD can be affected by the muzzle blast wave (MBW), resulting in an inaccurate initial velocity. A method for analyzing the effect of the MBW as it passes through the light screen is proposed in this article. First, based on the ray tracing method the refraction equation is established. The equation is to explain the transmission of rays from the light screen within the MBW media. Second, the equation is solved numerically using the fourth-order Runge-Kutta method. Then, the dynamical process of the MBW passing through the light screen is analyzed using the discretization method. Finally, the radiation flux on the photosensitive surface at the LSD receiver is analyzed quantitatively. The radiation flux for the MBW passing through the light screen located at different distances from the muzzle is analyzed in simulations and experiments. The mean absolute error between them and the theoretical calculation does not exceed 0.1. The results have been reasonably explained regarding the effect of the MBW as it passes through the light screen. This investigation not only helps the identification of the projectile signal in the light screen but also assists in identifying the MBW signal through independent measurements.
Keywords: external ballistic measurement 1, muzzle blast wave 2, light screen detector 3, ray tracing method 4, Refraction 5, radiation flux 6
Received: 26 Oct 2024; Accepted: 19 Feb 2025.
Copyright: © 2025 Duan, Ni, Tian, He and Li. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
* Correspondence:
Jinping Ni, School of Optoelectronic Engineering, Xi'an Technological University, Xi’an, 710021, Shaanxi Province, China
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