AUTHOR=Tian Dan , He Chun-Hui , He Ji-Huan TITLE=Fractal Pull-in Stability Theory for Microelectromechanical Systems JOURNAL=Frontiers in Physics VOLUME=9 YEAR=2021 URL=https://www.frontiersin.org/journals/physics/articles/10.3389/fphy.2021.606011 DOI=10.3389/fphy.2021.606011 ISSN=2296-424X ABSTRACT=

Pull-in instability was an important phenomenon in microelectromechanical systems (MEMS). In the past, MEMS were usually assumed to work in an ideal environment. But in the real circumstances, MEMS often work in dust-filled air, which is equivalent to working in porous media, that's mean fractal space. In this paper, we studied MEMS in fractal space and established the corresponding model. At the same time, we can control the occurrence time and stable time of pull-in by adjusting the value of the fractal index, and obtain a stable pull-in phenomenon.