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REVIEW article

Front. Photonics
Sec. Optical Information Processing and Holography
Volume 5 - 2024 | doi: 10.3389/fphot.2024.1492075

Single to Multiple Digital Holograms for Phase Compensation and Defect Detection

Provisionally accepted
Zhenkai Chen Zhenkai Chen 1*Wenjing Zhou Wenjing Zhou 1Zhou Ge Zhou Ge 1Yingjie Yu Yingjie Yu 1Hongbo Zhang Hongbo Zhang 2Ting-Chung Poon Ting-Chung Poon 3
  • 1 Shanghai University, Shanghai, China
  • 2 Middle Tennessee State University, Murfreesboro, North Carolina, United States
  • 3 Virginia Tech, Blacksburg, Virginia, United States

The final, formatted version of the article will be published soon.

    Digital holography enables quantitative phase imaging based on interference. A digital hologram often encodes the phase information along with aberrations or deformations. This article reviews phase analysis and its diverse application solutions and challenges in digital holography including aberrations removal in a single hologram, defect and deformation detection using dual-holograms, and defect location in multi-holograms. The state-of-the-art of the techniques are presented and discussed in detail for phase analysis, separation, and quantification. Phase analysis in digital holography can provide high precision, high resolution, rapid quantitative and intelligent imaging abilities.

    Keywords: Phase aberration, Deformation detection, Defect location, Dynamic detection, Digital Holography

    Received: 06 Sep 2024; Accepted: 05 Nov 2024.

    Copyright: © 2024 Chen, Zhou, Ge, Yu, Zhang and Poon. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

    * Correspondence: Zhenkai Chen, Shanghai University, Shanghai, China

    Disclaimer: All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.