AUTHOR=Xin Tong , Shen Lijun , Li Linlin , Chen Xi , Han Hua TITLE=Expected affine: A registration method for damaged section in serial sections electron microscopy JOURNAL=Frontiers in Neuroinformatics VOLUME=16 YEAR=2022 URL=https://www.frontiersin.org/journals/neuroinformatics/articles/10.3389/fninf.2022.944050 DOI=10.3389/fninf.2022.944050 ISSN=1662-5196 ABSTRACT=
Registration is essential for the volume reconstruction of biological tissues using serial section electron microscope (ssEM) images. However, due to environmental disturbance in section preparation, damage in long serial sections is inevitable. It is difficult to register the damaged sections with the common serial section registration method, creating significant challenges in subsequent neuron tracking and reconstruction. This paper proposes a general registration method that can be used to register damaged sections. This method first extracts the key points and descriptors of the sections to be registered and matches them