AUTHOR=Sardhara Trushal , Aydin Roland C. , Li Yong , Piché Nicolas , Gauvin Raynald , Cyron Christian J. , Ritter Martin TITLE=Training Deep Neural Networks to Reconstruct Nanoporous Structures From FIB Tomography Images Using Synthetic Training Data JOURNAL=Frontiers in Materials VOLUME=9 YEAR=2022 URL=https://www.frontiersin.org/journals/materials/articles/10.3389/fmats.2022.837006 DOI=10.3389/fmats.2022.837006 ISSN=2296-8016 ABSTRACT=
Focused ion beam (FIB) tomography is a destructive technique used to collect three-dimensional (3D) structural information at a resolution of a few nanometers. For FIB tomography, a material sample is degraded by layer-wise milling. After each layer, the current surface is imaged by a scanning electron microscope (SEM), providing a consecutive series of cross-sections of the three-dimensional material sample. Especially for nanoporous materials, the reconstruction of the 3D microstructure of the material, from the information collected during FIB tomography, is impaired by the so-called