AUTHOR=Puppe Daniel , Buhtz Christian , Kaczorek Danuta , Schaller Jörg , Stein Mathias TITLE=Microwave plasma atomic emission spectroscopy (MP-AES)—A useful tool for the determination of silicon contents in plant samples? JOURNAL=Frontiers in Environmental Science VOLUME=12 YEAR=2024 URL=https://www.frontiersin.org/journals/environmental-science/articles/10.3389/fenvs.2024.1378922 DOI=10.3389/fenvs.2024.1378922 ISSN=2296-665X ABSTRACT=
The accurate quantification of silicon (Si) contents in plant materials represents a fundamental prerequisite for agricultural plant-soil system or terrestrial ecosystem studies. Si contents in plants are usually calculated from Si concentrations determined spectroscopically in corresponding plant extracts. Inductively coupled plasma optical emission spectrometry (ICP-OES) is widely used in environmental sciences for Si measurements, because this technique is characterized by relatively high sensitivity and low expenditure of human labor. However, as an ICP-OES instrument is also characterized by relatively high acquisition and running costs, it is not readily available to most laboratories. Microwave plasma atomic emission spectroscopy (MP-AES) might represent a cost-effective alternative to ICP-OES. In our study we compared the results obtained from ICP-OES and MP-AES measurements of Si concentrations in Tiron extracts of husk and straw samples of winter wheat (