AUTHOR=Rao Lanlan , Xu Jian , Efremenko Dmitry S. , Loyola Diego G. , Doicu Adrian TITLE=Hyperspectral Satellite Remote Sensing of Aerosol Parameters: Sensitivity Analysis and Application to TROPOMI/S5P JOURNAL=Frontiers in Environmental Science VOLUME=9 YEAR=2022 URL=https://www.frontiersin.org/journals/environmental-science/articles/10.3389/fenvs.2021.770662 DOI=10.3389/fenvs.2021.770662 ISSN=2296-665X ABSTRACT=

Precise knowledge about aerosols in the lower atmosphere (optical properties and vertical distribution) is particularly important for studying the Earth’s climatic and weather conditions. Measurements from satellite sensors in sun-synchronous and geostationary orbits can be used to map distributions of aerosol parameters in global or regional scales. The new-generation sensor Tropospheric Monitoring Instrument (TROPOMI) onboard the Copernicus Sentinel-5 Precursor (S5P) measures a wide variety of atmospheric trace gases and aerosols that are associated with climate change and air quality using a number of spectral bands between the ultraviolet and the shortwave infrared. In this study, we perform a sensitivity analysis of the forward model parameters and instrument information that are associated with the retrieval accuracy of aerosol layer height (ALH) and optical depth (AOD) using the oxygen (O2) A-band. Retrieval of aerosol parameters from hyperspectral satellite measurements requires accurate surface representation and parameterization of aerosol microphysical properties and precise radiative transfer calculations. Most potential error sources arising from satellite retrievals of aerosol parameters, including uncertainties in aerosol models, surface properties, solar/satellite viewing geometry, and wavelength shift, are analyzed. The impact of surface albedo accuracy on retrieval results can be dramatic when surface albedo values are close to the critical surface albedo. An application to the real measurements of two scenes indicates that the retrieval works reasonably in terms of retrieved quantities and fit residuals.