Correlation Analysis of Insulation Failure Mechanism of High Voltage Switchgear in Complex Environment

Liqing Dai ¹ Xiali Li ^2*

• ¹ Fujian Chuanzheng Communications College, Fuzhou, Fujian, China
• ² Minzu University of China, Beijing, China

The safety of high voltage circuit is the most important. The mechanisms of short circuits in high voltage switches have been studied, wet insulation parts, surface pollution, short electrical safety distance and insulation failure of high voltage insulation shielding device. Implementing measures such as dust removal from switch suppressors, sealing gap adjustments, and other suppressor edge enhancements has resulted in stable switchgear operation. The lack of experience in the safe operation of power connections in permanently insulated switchgear and imperfect operational check methods necessitate a study of insulation failure and aging mechanisms under operating conditions. We performed solid sealing of the core part of solid-insulated switchgear based on operating conditions, conducted three-dimensional modeling to analyze epoxy resin insulation stress distribution, and designed different structures through abstract modeling. Sealed insulation parts of the corresponding structure were prepared through equivalent test analysis, followed by an accelerated electrical aging test to determine specimen aging life. Insulation parameters were measured at different aging stages to establish the aging relationship between specimen insulation parameters and insulation material, ensuring compliance with safety and environmental protection requirements. The innovation of this paper is to reveal the deterioration mechanism of epoxy surface materials under high pressure and the failure mechanism of long-term insulation of SF6 epoxy interface.