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ORIGINAL RESEARCH article

Front. Energy Res.
Sec. Sustainable Energy Systems
Volume 12 - 2024 | doi: 10.3389/fenrg.2024.1413910
This article is part of the Research Topic Emerging Technologies for the Construction of Renewable Energy-Dominated Power System View all 29 articles

The analysis of the threshold value of the complex short-circuit ratio index and its significance in the context of static voltage stability

Provisionally accepted
Lei Pan Lei Pan *
  • School of Electrical Engineering, Shanghai University of Electric Power, Shanghai, China

The final, formatted version of the article will be published soon.

    The short-circuit ratio index(SCR) can effectively quantify the voltage support strength in traditional DC grid-connected scenarios, yet it cannot reasonably describe the voltage support strength in diverse device grid connection scenarios. This paper introduces a new calculation method of the complex short-circuit ratio index(  SCR ) and derives the threshold value of the complex short-circuit ratio index to enable a comprehensive quantitative assessment of grid voltage support strength across diverse device grid connection scenarios. Firstly, critical short-circuit ratio(CSCR) under different assumed conditions were derived based on the short-circuit ratio index. Secondly, the calculation method of the complex short-circuit ratio index was introduced, considering both the equivalent impedance angle of the device and the Thevenin equivalent impedance angle. This was followed by the determination of the threshold value of the complex short-circuit ratio(  CSCR ), enabling a precise quantitative evaluation of power grid voltage support strength in diverse device grid connection scenarios. Finally, the example analysis proves the accuracy and efficacy of the complex short-circuit ratio index in assessing the voltage support strength of diverse devices in grid-connected scenarios.

    Keywords: Power grid strength, Short-circuit ratio index, Critical short-circuit ratio, Complex short-circuit ratio index, The threshold value of the complex short-circuit ratio

    Received: 08 Apr 2024; Accepted: 03 Jun 2024.

    Copyright: © 2024 Pan. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

    * Correspondence: Lei Pan, School of Electrical Engineering, Shanghai University of Electric Power, Shanghai, China

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