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ORIGINAL RESEARCH article

Front. Electron.
Sec. Nano- and Microelectronics
Volume 6 - 2025 | doi: 10.3389/felec.2025.1497940

Comprehensive Analysis of In 0.53 Ga 0.47 As SOI-FinFET for Enhanced RF/Wireless Performance

Provisionally accepted
Priyanka Agrwal Priyanka Agrwal Ajay Kumar Ajay Kumar *
  • Jaypee Institute of Information Technology, Noida, India

The final, formatted version of the article will be published soon.

    This paper comprehensively analyses the RF (Radio Frequency) and wireless performance characteristics of high-k In0.53Ga0.47As silicon-on-insulator FinFET (InGaAs-SOI-FinFET). Firstly, the fundamental operating principles and unique features of InGaAs-SOI-FinFET are discussed, highlighting their three-dimensional fin structure and improved electrostatic control, which contributes to enhanced electrostatic integrity and reduced leakage currents compared to traditional CMOS technologies. The linearity performance of InGaAs-SOI-FinFET focuses on parameters such as third-order intercept point (IP3) and linearity metrics in analog circuits. The influence of device geometry, biasing schemes, and operating conditions on linearity characteristics and strategies for enhancing linearity while maintaining high-frequency performance is examined. Subsequently, an in-depth analysis of the RF performance metrics, such as fT, fMAX, TFP, GFP and GTFP. Thus, emerging trends and challenges in leveraging InGaAs-SOI-FinFET for RF and linearity-critical applications include circuit design, process integration, and reliability considerations.

    Keywords: C-FinFET, InGaAs-SOI-FinFET, linearity, SOI-FinFET, RF

    Received: 18 Sep 2024; Accepted: 13 Jan 2025.

    Copyright: © 2025 Agrwal and Kumar. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

    * Correspondence: Ajay Kumar, Jaypee Institute of Information Technology, Noida, India

    Disclaimer: All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.