Perspective
Published on 17 May 2024
On the importance of varying device thickness and temperature on the outcome of space-charge-limited current measurements
Frontiers in Electronic Materials
doi 10.3389/femat.2024.1396521
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Perspective
Published on 17 May 2024
Review
Published on 09 May 2024
Editorial
Published on 17 Apr 2024
Correction
Published on 03 Apr 2024
Review
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Original Research
Published on 08 Mar 2024
Review
Published on 15 Feb 2024