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PERSPECTIVE article

Front. Electron. Mater
Sec. Superconducting Materials
Volume 4 - 2024 | doi: 10.3389/femat.2024.1487856
This article is part of the Research Topic Exploring strongly correlated materials using resonant inelastic x-ray scattering View all articles

Advances in Hard X-Ray RIXS toward meV Resolution in the Study of 5d Transition Metal Materials

Provisionally accepted
Jungho KIM Jungho KIM *XiangRong Huang XiangRong Huang Thomas Toellner Thomas Toellner Ayman Said Ayman Said
  • Advanced Photon Source (DOE), Lemont, United States

The final, formatted version of the article will be published soon.

    Resonant inelastic X-ray scattering (RIXS) has played a pivotal role in advancing our understanding of spin-orbit physics in 5d transition metal materials. The progress in RIXS techniques has closely paralleled improvements in energy resolution, which have enabled the study of very low-lying excitations and led to the discovery of numerous new phenomena with significant scientific and technological implications. The multi-bend achromat (MBA) lattice upgrade of third-generation synchrotron sources, such as the Advanced Photon Source (APS), heralds a transformative era by introducing enhancements in brilliance and emittance. These advancements provide an opportunity to push the boundaries of RIXS techniques, meeting the challenges at the research frontiers of material science. This article aims to highlight key instrumental and technical advancements that enable the achievement of meV resolution in RIXS and discuss the impact of such high-resolution RIXS on exploring spin-orbit physics in 5d transition metal materials.

    Keywords: Resonant inelastic X-ray scattering, 5d transition metal, MeV energy resolution, lower symmetry crystal, Magnetic Excitations

    Received: 28 Aug 2024; Accepted: 23 Sep 2024.

    Copyright: © 2024 KIM, Huang, Toellner and Said. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

    * Correspondence: Jungho KIM, Advanced Photon Source (DOE), Lemont, United States

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